PDF Ebook Properties of Crystalline Silicon (Emis Series), by R. Hull
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Properties of Crystalline Silicon (Emis Series), by R. Hull
PDF Ebook Properties of Crystalline Silicon (Emis Series), by R. Hull
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A unique and well-organised reference, this book provides illuminating data, distinctive insight and expert guidance on silicon properties.
Also available:
Properties of III-V Quantum Wells and Superlattices - ISBN 9780852968819
Properties of Porous Silicon - ISBN 9780863415555
The Institution of Engineering and Technology is one of the world's leading professional societies for the engineering and technology community. The IET publishes more than 100 new titles every year; a rich mix of books, journals and magazines with a back catalogue of more than 350 books in 18 different subject areas including:
-Power & Energy
-Renewable Energy
-Radar, Sonar & Navigation
-Electromagnetics
-Electrical Measurement
-History of Technology
-Technology Management
- Sales Rank: #4871314 in Books
- Published on: 1999-01-01
- Original language: English
- Dimensions: 11.50" h x 8.75" w x 2.50" l,
- Binding: Hardcover
- 1042 pages
Most helpful customer reviews
1 of 1 people found the following review helpful.
a unique reference on silicon materials science
By +++
This is a unique book in terms of its coverage. It is certainly the most complete and up-to-date reference book on the properties of crystalline silicon. Written by the leading specialists in the field, it combines tables and diagrams with brief discussions of the sources where the data were taken from, and the physics behind the data. If there is a book where one can find answers to most silicon-related questions, than this is this one. Just look at the table of contents: Melt growth; Epitaxial growth; structural and mechanical properties; thermal properties; surface properties and cleaning; structural modelling; band structure; electrical properties; impurities in silicon; dopants in silicon; defect levels in silicon; optical properties; photoconductivity and photogenerated carriers; implantation and irradiation of silicon; gettering; etching; metal-silicon contacts; silicon on insulator technology. It is not a textbook for students, through (even if students could afford buying it) since its concise (database-like) style of writing anticipates some prior level of knowledge. However, it is a highly recommended book for a collective posession by a laboratory or by a research team.
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